长垣产业园区科技文献服务平台

期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2010, vol.59, no.1 2010, vol.59, no.10 2010, vol.59, no.11 2010, vol.59, no.12 2010, vol.59, no.2 2010, vol.59, no.3
2010, vol.59, no.4 2010, vol.59, no.5 2010, vol.59, no.6 2010, vol.59, no.7 2010, vol.59, no.8 2010, vol.59, no.9

题名作者出版年年卷期
Distributed Unsupervised Gaussian Mixture Learning for Density Estimation in Sensor NetworksBehrooz Safarinejadian; Mohammad B. Menhaj; Mehdi Karrari20102010, vol.59, no.9
Experimental Investigation of Ultrasound Wave Focusing in Attenuative SolidsAbhijit Ganguli; Robert X. Gao; K. Liang; J. Jundt; Andres Ordonez20102010, vol.59, no.9
Impact of Decorrelation Techniques on Sampling Noise in Radio-Frequency ApplicationsKeir C. Lauritzen; Salvador H. Talisa; Martin Peckerar20102010, vol.59, no.9
A Spatially Selective Correlative Filtration Method Based on the Multiscale Edge Shift-Correlative TechniqueYan Liu; Wei Liang Tao; Kai Liu20102010, vol.59, no.9
An Open-Source Scaled Automobile Platform for Fault-Tolerant Electronic Stability ControlDiomidis I. Katzourakis; Ioannis Papaefstathiou; Michail G. Lagoudakis20102010, vol.59, no.9
Active Noise Cancellation Without Secondary Path Identification by Using an Adaptive Genetic AlgorithmCheng-Yuan Chang; Deng-Rui Chen20102010, vol.59, no.9
Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine FittingFrancisco Correa Alegria; Antonio Cruz Serra20102010, vol.59, no.9
A Fully Integrated Built-In Self-Test Σ-Δ ADC Based on the Modified Controlled Sine-Wave Fitting ProcedureHao-Chiao Hong; Fang-Yi Su; Shao-Feng Hung20102010, vol.59, no.9
A Knowledge-Based Approach to Online Fault Diagnosis of FET BiosensorsChristina G. Siontorou; Fragiskos A. Batzias; Victoria Tsakiri20102010, vol.59, no.9
Imaging Systems and Algorithms for the Numerical Characterization of Three-Dimensional Shapes of Granular ParticlesMichael Bloom; Jonathan Corriveau; Patrick Giordano, Jr.; George D. Lecakes, Jr.; Shreekanth Mandayam; Beena Sukumaran20102010, vol.59, no.9
123



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024