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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2003, vol.52, no.1 2003, vol.52, no.2 2003, vol.52, no.3 2003, vol.52, no.4 2003, vol.52, no.5 2003, vol.52, no.6

题名作者出版年年卷期
An Embryonic Approach to Reliable Digital Instrumentation Based on Evolvable HardwareVishal Sahni; V. Prem Pyara20032003, vol.52, no.6
The Design of Reliable Devices for Mission-Critical ApplicationsCristiana Bolchini; Luigi Pomante; Fabio Salice; Donatella Sciuto20032003, vol.52, no.6
Modeling and Analysis of Soft-Test/Repair for CCD-Based Digital X-Ray SystemsB. Jin; Nohpill Park; K. M. George; Minsu Choi; M. B. Yeary20032003, vol.52, no.6
Self-Checking Design, Implementation, and Measurement of a Controller for Track-Side Railway SystemsLuca Schiano; Cecilia Metra; Diego Marino20032003, vol.52, no.6
SPaRe: Selective Partial Replication for Concurrent Fault-Detection in FSMsPetros Drineas; Yiorgos Makris20032003, vol.52, no.6
Time-to-Voltage Converter for On-Chip Jitter MeasurementTian Xia; Jien-Chung Lo20032003, vol.52, no.6
Analysis and Measurement of Timing Jitter Induced by Radiated EMI Noise in Automatic Test EquipmentY. J. Lee; T. Kane; J.-J. Lim; L. Schiano; Y.-B. Kim; F. J. Meyer; F. Lombardi; S. Max20032003, vol.52, no.6
A Versatile Built-in CMOS Sensing Device for Digital Circuit Parametric TestMarco S. Dragic; Martin Margala20032003, vol.52, no.6
A Displacement-Measuring Instrument Utilizing Self-Mixing InterferometryM. Norgia; S. Donati20032003, vol.52, no.6
Classification of Audio Radar signals Using Radial Basis Function Neural NetworksTrent McConaghy; Henry Leung; Eloi Bosse; Vinay Varadan20032003, vol.52, no.6
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