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期刊
ISSN
0018-9456
刊名
IEEE Transactions on Instrumentation and Measurement
参考译名
IEEE测试设备与测量汇刊
收藏年代
1998~2013
关联期刊
参考译名
收藏年代
IEEE Transactions on Instrumentation and Measurement
IEEE测试设备与测量汇刊
全部
1998
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2002
2003
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2005
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2003, vol.52, no.1
2003, vol.52, no.2
2003, vol.52, no.3
2003, vol.52, no.4
2003, vol.52, no.5
2003, vol.52, no.6
题名
作者
出版年
年卷期
Space Compaction of Test Responses Using Orthogonal Transmission Functions
Krishnendu Chakrabarty; Markus Seuring
2003
2003, vol.52, no.5
Parity Bit Signature in Response Data Compaction and Built-in Self-Testing of VLSI Circuits With Nonexhaustive Test Sets
Sunil R. Das; Made Sudarma; Mansour H. Assaf; Emil M. Petriu; Wen-Ben Jone; Krishnendu Chakrabarty; Mehmet Sahinoglu
2003
2003, vol.52, no.5
An Efficient BIST Method for Non-Traditional Faults of Embedded Memory Arrays
Wen-Ben Jone; Der-Chen Huang; Sunil R. Das
2003
2003, vol.52, no.5
Self-Checking Logic Design for FPGA Implementation
Parag K. Lala; Alfred L. Burress
2003
2003, vol.52, no.5
A Self-Binning BIST Structure for Data Communications Transceivers
San L. Lin; Shoba Krishnan; Samiha Mourad
2003
2003, vol.52, no.5
Architecture, Design, and Application of an Event-Based Test System
Rochit Rajsuman
2003
2003, vol.52, no.5
An Empirical Bayesian Stopping Rule in Testing and Verification of Behavioral Models
Mehmet Sahinoglu
2003
2003, vol.52, no.5
Test Limitations of Parametric Faults in Analog Circuits
Jacob Savir; Zhen Guo
2003
2003, vol.52, no.5
Single-Clock, Single-Latch9 Scan Design
Amit M. Sheth; Jacob Savir
2003
2003, vol.52, no.5
A Cost-Effective Wafer-Level Reliability Test System for Integrated Circuit Makers
Summer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai
2003
2003, vol.52, no.5
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