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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2012, vol.2012

题名作者出版年年卷期
Full-Speed Simultaneous EBSD and Spectral Image EDS Analysis of Dual-Phase SteelPatrick Camus20122012, vol.2012
Is Energy-Dispersive Spectroscopy in the SEM a Substitute for Electron Probe Microanalysis?Ian Holton20122012, vol.2012
Quantitative Four-Dimensional Electron Diffraction in the TEMChristoph T. Koch; V. Burak Ozdol; Kazuo Ishizuka20122012, vol.2012
Microstructure and Mechanical Properties of High Toughness, Control Rolled Copper-Niobium Steels with Zero Nickel ContentDavid M. Nicholas; Eric A. Wilson; Wei Sha20122012, vol.2012
SEM, EDX & XRD of Zinc Oxide Nano-structures Synthesized by Zinc OxidationSyed Nasimul Alam; Madhukar Poloju; Shakti Swarup Sahu; Manish Kumar; Animesh Kumar Singh20122012, vol.2012
Scanning Probe Microscope Techniques for the Engineering of Nanoelectronic DevicesLandon Prisbrey; Ji-Yong Park; Kerstin Blank; Amir Moshar; Ethan D. Minot20122012, vol.2012
Solar Cell Diagnostics using Kelvin Force Microscopy and Local PhotoexcitationAlexander V. Ankudinov20122012, vol.2012
Nanoscale Infrared Spectroscopy and AFM Imaging of a Polycarbonate/Acrylonitrile-Styrene/Butadiene BlendJiping Ye; Hiromi Midorikawa; Tadashi Awatani; Curtis Marcott; Michael Lo; Kevin Kjoller; Roshan Shetty20122012, vol.2012
Confocal Raman and AFM Analysis of Laser Lithographically Written Structures in SiliconJulian P. Heath20122012, vol.2012
True Sample AFM Topography using a Low-Noise Z-Position SensorAhram Kim20122012, vol.2012
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