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期刊


ISSN0020-4412
刊名Instruments and Experimental Techniques
参考译名仪表与实验技术
收藏年代1999～2023



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2023

2008, vol.51, no.1 2008, vol.51, no.2 2008, vol.51, no.3 2008, vol.51, no.4 2008, vol.51, no.5 2008, vol.51, no.6

题名作者出版年年卷期
A Technique for Measuring an Adsorption-Induced DeformationA. V. Shkolin; A. A. Fomkin; A. L. Pulin; V. Yu. Yakovlev20082008, vol.51, no.1
Measurements of the Solidification Point of the GKGh-136 Silicone LiquidL. I. Buravov; V. N. Zverev; A. V. Kazakova; N. D. Kushch; A. I. Manakov20082008, vol.51, no.1
Measuring the Lithium Layer ThicknessB. F. Bayanov; E. V. Zhurov; S. Yu. Taskaev20082008, vol.51, no.1
A Gas Microflowmeter with a Specified Sensitivity ValueA. V. Rumyantsev; K. V. Gus'kov20082008, vol.51, no.1
A Starting Device for a Metal Plasma SourceA. N. Grigor'ev; A. K. Turchina20082008, vol.51, no.1
A Thin-Film Resistive Sensor for Measuring Atomic Hydrogen Flux DensityV. A. Kagadei; E. V. Nefedtsev; D. I. Proskurovskii; S. V. Romanenko; V. V. Chupin20082008, vol.51, no.1
The CORSET Time-of-Flight Spectrometer for Measuring Binary Products of Nuclear ReactionsE. M. Kozulin; A. A. Bogachev; M. G. Itkis; I. M. Itkis; G. N. Knyazheva; N. A. Kondratiev; L. Krupa; I. V. Pokrovsky; E. V. Prokhorova20082008, vol.51, no.1
Measuring the Thickness of Dead Layers in Semiconductor DetectorsYu. B. Gurov; S. V. Isakov; V. S. Karpukhin; S. V. Lapushkin; V. G. Sandukovsky; B. A. Chernyshev20082008, vol.51, no.1
Calibration of the Scintillation Trigger Detector of the Forward Muon System for the DO ExperimentV. A. Bezzubov; I. A. Vasil'ev; V. N. Evdokimov; V. V. Lipaev; A. A. Shchukin; I. N. Churin; D. S. Denisov; V. M. Podstavkov20082008, vol.51, no.1
Application of a Low-Energy Electron Beam as a Tool of Nondestructive Diagnostics of Intense Charged-Particle BeamsP. V. Logachev; D. A. Malyutin; A. A. Starostenko20082008, vol.51, no.1
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