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期刊


ISSN0013-4686
刊名Electrochimica Acta
参考译名国际电化学杂志：电化学学报
收藏年代1998～2024



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2000, vol.45, no.10 2000, vol.45, no.11 2000, vol.45, no.12 2000, vol.45, no.13 2000, vol.45, no.14 2000, vol.45, no.15-16
2000, vol.45, no.17 2000, vol.45, no.18 2000, vol.45, no.19 2000, vol.45, no.20 2000, vol.45, no.21 2000, vol.45, no.22-23
2000, vol.45, no.24 2000, vol.45, no.25-26 2000, vol.45, no.27 2000, vol.45, no.28 2000, vol.45, no.8-9 2000, vol.46, no.1
2000, vol.46, no.2-3 2000, vol.46, no.4 2000, vol.46, no.5

题名作者出版年年卷期
Boron doped diamond (BDD)-layers on titanium substrates as electrodes in applied electrochemistryF. Beck; W. Kaiser; H. Krohn20002000, vol.45, no.28
Electron transport and back reaction in dye sensitised nanocrystalline photovoltaic cellsL. M. Peter; K. G. U. Wijayantha20002000, vol.45, no.28
Fast processes at semiconductor-liquid interfaces: reactions at GaAs electrodesKerstin Siemoneit; Rolf Reineke-Koch; Andreas Meier; Rudiger Memming20002000, vol.45, no.28
Formation and corrosion of InP/In contacts in hydrochloric acidAchim Walter Hassel; Matsuhide Aihara; Masahiro Seo20002000, vol.45, no.28
In-situ atomic force microscopy of silicon (100) in aqueous potassium hydroxideP. Raisch; W. Haiss; R. J. Nichols; D. J. Schiffrin20002000, vol.45, no.28
Is there a limit for the passivation of Si surfaces during anodic oxidation in acidic NH{sub}4F solutions?J. Rappich; V. Yu. Timoshenko; R. Wurz; Th. Dittrich20002000, vol.45, no.28
Metal deposition on n-Si(111):H electrodesJ. C. Ziegler; A. Reitzle; O. Bunk; J. Zegenhagen; D. M. Kolb20002000, vol.45, no.28
Metal sulfide semiconductor electrochemical mechanisms induced by bacterial activityH. Tributsch; J. A. Rojas-Chapana20002000, vol.45, no.28
Reactions of Si-H to Si-X (X = halogen) bonds at H-terminated Si(111) surfaces in hydrogen halide solutions in the presence of oxidantsXiaowen Zhou; Masaki Ishida; Akihito Imanishi; Yoshihiro Nakato20002000, vol.45, no.28
Surface analysis of the electropolishing layer on Si(111) in ammonium fluoride solutionH. J. Lewerenz; H. Jungblut; S. Rauscher20002000, vol.45, no.28
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