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期刊


ISSN8756-6990
刊名Optoelectronics, Instrumentation and Data Processing
参考译名光电子学、仪表与数据处理
收藏年代2000～2023



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2016, vol.52, no.1 2016, vol.52, no.2 2016, vol.52, no.3 2016, vol.52, no.4 2016, vol.52, no.5 2016, vol.52, no.6

题名作者出版年年卷期
Analysis of Random Point Images with the Use of Symbolic Computation Codes and Generalized Catalan NumbersA. L. Reznik; A. V. Tuzikov; A. A. Solov'ev; A. V. Torgov20162016, vol.52, no.6
Methods of Image Reconstruction and Hardware Function Evaluation Based on a Thinned Observation MatrixV. K. Klochko; V. P. Kuznetsov20162016, vol.52, no.6
Measuring Information Signal Parameters under Additive Non-Gaussian Correlated NoiseV. M. Artyushenko; V. I. Volovach20162016, vol.52, no.6
Comparative Analysis of the Performance of Laser Doppler Systems using Maximum Likelihood and Phase Increment MethodsV. S. Sobolev; F. A. Zhuravel'; G. A. Kashcheeva20162016, vol.52, no.6
Development of Active Filtering Algorithms for Higher Harmonics in Electrical Power CircuitsO. V. Nos; S. V. Brovanov; M. A. Dybko20162016, vol.52, no.6
Spectral Method for Processing Signals of a High-Accuracy Laser RadarA. V. Klimov; V. G. Glavnyi; G. V. Bakakin; V. G. Meledin20162016, vol.52, no.6
Calculation of the Object Edge Position after Its Projection in a Spatially Noninvariant Coherent Optical SystemYu. V. Chugui20162016, vol.52, no.6
Boson Peak in Low-Frequency Raman Spectra of PolymethylmethacrylateM. A. Korshunov; V. F. Shabanov20162016, vol.52, no.6
Measurement of the Characteristics of Ultrahigh-Frequency Optical Modulators by a Scanning InterferometerS. N. Atutov; S. L. Mikerin; A. E. Simanchuk; V. A. Sorokin; A. I. Plekhanov20162016, vol.52, no.6
Optoelectronic Scanning System Upgrade by Energy Center Localization MethodsW. Flores-Fuentes; O. Sergiyenko; J. C. Rodriguez-Quinonez; M. Rivas-Lopez; D. Hernandez-Balbuena; L. C. Basaca-Preciado; L. Lindner; F. F. Gonzalez-Navarro20162016, vol.52, no.6
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