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ISSN0285-2470
刊名材料試験技術
参考译名材料试验技术
收藏年代1998~2024



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2007, vol.52, no.1 2007, vol.52, no.2 2007, vol.52, no.3

题名作者出版年年卷期
Application of Electronic Speckle Pattern Interferometry to High-speed PhenomenaSyuichi ARIKAWA; John A. GAFFNEY; Kenji GOMI; Kensuke ICHINOSE; Tetsuya IKEDA; Takashi MITA; Robert L. ROURKS; Christopher SCHNEIDER; Sanichiro YOSHIDA20072007, vol.52, no.3
Nanoscale Verification of Hardness Indenters by Atomic Force MicroscopySatoshi TAKAGP; Takashi USUDA; Rugkanawan KONGKAVITOOL; Tatsuya ISHIBASHI20072007, vol.52, no.3