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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2016 2016, no.Suppl.

题名作者出版年年卷期
Advances in ex situ lift-out and specimen preparation manipulation methodsLucille A. Giannuzzi20162016, no.Suppl.
WITecCHRIS PARMENTER20162016, no.Suppl.
PARK SYSTEMSCHRIS PARMENTER20162016, no.Suppl.
KEYSIGHT TECHNOLOGIESCHRIS PARMENTER20162016, no.Suppl.
JPK INSTRUMENTSCHRIS PARMENTER20162016, no.Suppl.
HITACHI HIGH-TECH SCIENCECHRIS PARMENTER20162016, no.Suppl.
BRUKER NANO SURFACESKhaled Kaja; Peter De Wolf20162016, no.Suppl.
OXFORD INSTRUMENTS ASYLUM RESEARCH AFMs - Crack propagation in bone captured with in situ mechanical testing during AFMO. Katsamenis; T. Boughen; P. J. Thurner20162016, no.Suppl.
OXFORD INSTRUMENTS ASYLUM RESEARCH AFMs - Get a charge: Nanoelectrical characterization techniquesCHRIS PARMENTER20162016, no.Suppl.
Layers of understanding: AFM characterization of thin-film structure and propertiesDonna Hurley; Florian Johann; Keith Jones; Marta Kocun; Jianjun Yao; Jason Li; Ben Ohler20162016, no.Suppl.



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