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期刊
ISSN
2043-0639
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——美洲版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2016
2016, no.Suppl.
题名
作者
出版年
年卷期
Advances in ex situ lift-out and specimen preparation manipulation methods
Lucille A. Giannuzzi
2016
2016, no.Suppl.
WITec
CHRIS PARMENTER
2016
2016, no.Suppl.
PARK SYSTEMS
CHRIS PARMENTER
2016
2016, no.Suppl.
KEYSIGHT TECHNOLOGIES
CHRIS PARMENTER
2016
2016, no.Suppl.
JPK INSTRUMENTS
CHRIS PARMENTER
2016
2016, no.Suppl.
HITACHI HIGH-TECH SCIENCE
CHRIS PARMENTER
2016
2016, no.Suppl.
BRUKER NANO SURFACES
Khaled Kaja; Peter De Wolf
2016
2016, no.Suppl.
OXFORD INSTRUMENTS ASYLUM RESEARCH AFMs - Crack propagation in bone captured with in situ mechanical testing during AFM
O. Katsamenis; T. Boughen; P. J. Thurner
2016
2016, no.Suppl.
OXFORD INSTRUMENTS ASYLUM RESEARCH AFMs - Get a charge: Nanoelectrical characterization techniques
CHRIS PARMENTER
2016
2016, no.Suppl.
Layers of understanding: AFM characterization of thin-film structure and properties
Donna Hurley; Florian Johann; Keith Jones; Marta Kocun; Jianjun Yao; Jason Li; Ben Ohler
2016
2016, no.Suppl.
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