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期刊
ISSN
2043-0639
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——美洲版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2015
题名
作者
出版年
年卷期
Recent observations of structure, in situ defect formation, and synthesis of 2D materials using atomic - resolution TEM
Zonghoon Lee
2015
2015
Fuel cells and ceramics - characterizing real-world samples with a FE-SEM ready for challenges
L. Maniguet; F. Roussel; R. Martin; E. Djurado; M. C. Steil; E. Bichaud; A. Le Goff; M. Holzinger; S. Cosnier; J. M. Chaix; C. Carry
2015
2015
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?
A. De Backer; A. De Wael; J. Gonnissen; G. T. Martinez; A. Beche; K. E. MacArthur; L. Jones; P. D. Nellist; S. Van Aert
2015
2015
The architect with a microscope
Chris Parmenter
2015
2015
Fluorescent dye survives super-resolution imaging
Chris Parmenter
2015
2015
Extreme electron tomography
Chris Parmenter
2015
2015
Small World winners revealed
Chris Parmenter
2015
2015
High praise for Portland
Chris Parmenter
2015
2015
Transmission electron microscopy study of interface driven resistive switching in epitaxial NiO nanocrystals
Xuan Cheng; Jivika Sullaphen; Matthew Weyland; Hongwei Liu; Nagarajan Valanoor
2015
2015
New insights in silver alloy corrosion delivered by digital light microscopy reveal information otherwise undetectable by SEM
Olivier Schalm; Patrick Storme
2015
2015
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