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2007, vol.52, no.1

2007, vol.52, no.2

2007, vol.52, no.3

题名	作者	出版年	年卷期
Application of Electronic Speckle Pattern Interferometry to High-speed Phenomena	Syuichi ARIKAWA; John A. GAFFNEY; Kenji GOMI; Kensuke ICHINOSE; Tetsuya IKEDA; Takashi MITA; Robert L. ROURKS; Christopher SCHNEIDER; Sanichiro YOSHIDA	2007	2007, vol.52, no.3
Nanoscale Verification of Hardness Indenters by Atomic Force Microscopy	Satoshi TAKAGP; Takashi USUDA; Rugkanawan KONGKAVITOOL; Tatsuya ISHIBASHI	2007	2007, vol.52, no.3