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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2006 2007 2008 2009 2010 2011
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2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS CircuitsBIPUL C. PAUL; KAUSHIK ROY20062006, vol.22, no.2
Implementing Symmetric Functions with Hierarchical Modules for Stuck-at and Path-Delay Fault TestabilityHAFIZUR RAHAMAN; DEBESH K. DAS; BHARGAB B. BHATTACHARYA20062006, vol.22, no.2
Concurrent Error Detection in a Polynomial Basis Multiplier over GF(2{sup}m)CHIOU-YNG LEE; CHE WUN CHIOU; JIM-MIN LIN20062006, vol.22, no.2
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple FaultsYU-CHIUN LIN; SHI-YU HUANG20062006, vol.22, no.2
An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAsPATRICK GIRARD; OLIVIER HERON; SERGE PRAVOSSOUDOVITCH; MICHEL RENOVELL20062006, vol.22, no.2
Crosstalk Induced Fault Analysis and Test in DRAMsZEMO YANG; SAMIHA MOURAD20062006, vol.22, no.2
Electro-thermal Stimuli for MEMS Testing in FSBM TechnologyN. DUMAS; F. AZAIS; L. LATORRE; P. NOUET20062006, vol.22, no.2
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic SystemsFEI SU; SULE OZEV; KRISHNENDU CHAKRABARTY20062006, vol.22, no.2



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