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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：超导性电子学
收藏年代2000～2023



全部

2000 2001 2002 2009 2010 2011
2012 2013 2014 2017 2019 2020
2021 2022 2023

2000, vol.100, no.24 2000, vol.100, no.274 2000, vol.100, no.399 2000, vol.100, no.572

题名作者出版年年卷期
Design of phase mode parallel multiplierMasashi Seki; Takeshi Onomi; Koji Nakajima20002000, vol.100, no.572
A single-rail asynchronous full adderYukiyasu Nakamura; Masahiro Sakamoto; Michitada Morisue; Hisato Fujisaka20002000, vol.100, no.572
X-ray detection using superconducting tunnel junction with microstrip-coilT. Taino; H. Nakagawa; M. Aoyagi; H. Akoh; H. Sato; K. Maehata; K. Ishibashi; H. Sato; T. Ikeda; C. Otani; T. Oku; H. Kato; K. Kawai; Y. Takizawa; H. Miyasaka; H. Watanabe; H. M. Shimizu20002000, vol.100, no.572
Design of miniaturized HTS coplanar waveguide bandpass filters with highly packed meanderlinesTatsunori Shinto Youko Koga; Haruichi Kanaya; Keiji Yoshida; Tetsuji Uchiyama; Zhen Wang20002000, vol.100, no.572
Normal-distribution-function-shaped Josephson tunnel junctions for STJ detectorsKatsuya Kikuchi; Takeshi Iizuka; Hiroaki Myoren; Susumu Takada20002000, vol.100, no.572
Influence of thermal cycling on TLF observed in epitaxial NbN/MgO/NbN tunnel junctionsH. Ishida; Y. Takeuchi; A. Saito; A. Kawakami; Z. Wang; K. Hamasaki20002000, vol.100, no.572
Observation of recrystallization process of interface-modified barrier and the properties of interface-modified ramp-edge junctionsY. Ishimaru; Y. Wu; O. Horibe; H. Tano; T. Suzuki; Y. Tarutani; U. Kawabe; K. Tanabe20002000, vol.100, no.572
Fabrication of c-axis oriented YBaCuO trilayer junction with Ar plasma treatmentTakahiro Kaneda; Toshikazu Yamada; Hiroshi Sato; Hiroshi Yamamoto; Hiroshi Akoh20002000, vol.100, no.572
The high J{sub}c large area YBCO film by metalorganic deposition method using trifluoroacetatesTakeshi Araki; SoekBoem Kim; Katsumi Suzuki; Yutaka Yamada; Izumi Hirabayashi20002000, vol.100, no.572
Measurement of surface resistance of large area superconducting filmsM. Kusunoki; M. Mukaida; S. Ohshima; M. Lorenz; H. Hochmuth; D. Natusch; T. Tahrigen20002000, vol.100, no.399
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