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期刊


ISSN1226-3192;2005-2863
刊名Journal of the Korean Statistical Society
参考译名韩国统计学会志
收藏年代2021～2025



全部

2021 2022 2023 2024 2025

2025, vol.54, no.1

题名作者出版年年卷期
A break test for the tail-event correlation matrix based on the self-normalization methodChoi, Ji-Eun; Shin, Dong WanChoi, Ji-Eun; Shin, Dong Wan20252025, vol.54, no.1
Dimensionality reduction through clustering of variables and canonical correlationMunoz-Pichardo, Juan M.; Pino-Mejias, Rafael; Cubiles-de-la-Vega, M. Dolores; Enguix-Gonzalez, AliciaMunoz-Pichardo, Juan M.; Pino-Mejias, Rafael; Cubiles-de-la-Vega, M. Dolores; Enguix-Gonzalez, Alicia20252025, vol.54, no.1
Sequential Monte Carlo ABC: an overview with application to COVID-19 dataHan, Dongu; Kim, Minhyeok; Koh, Eunyoung; Kobayashi, Genya; Choi, TaeryonHan, Dongu; Kim, Minhyeok; Koh, Eunyoung; Kobayashi, Genya; Choi, Taeryon20252025, vol.54, no.1
Asymptotic normality of kernel functional regression estimator based upon twice censored dataSarra, LeulmiSarra, Leulmi20252025, vol.54, no.1
Bayesian analysis of Box-Cox transformation model for multi-state progression-free survival dataWang, Chunjie; Qi, Shunxin; Jiang, JingjingWang, Chunjie; Qi, Shunxin; Jiang, Jingjing20252025, vol.54, no.1
Interval-valued linear regression model with an asymmetric Laplace distributionGuan, Li; Li, MengxiaoGuan, Li; Li, Mengxiao20252025, vol.54, no.1
Garrotized kernel machine in semiparametric quantile regressionZhao, Xinyi; Rong, Yaohua; Tian, MaozaiZhao, Xinyi; Rong, Yaohua; Tian, Maozai20252025, vol.54, no.1
Community detection for networks based on Monte Carlo type algorithmsYu, WeiYu, Wei20252025, vol.54, no.1
Using statistical models for optimal packaging in semiconductor manufacturing processesKim, Dongguen; Kim, Heejin; Kim, Yejin; Chae, Minwoo; Ko, Young Myoung; Bae, Young-Mok; Sim, Hyungsub; Oh, Young Chan; Noh, Keum HwanKim, Dongguen; Kim, Heejin; Kim, Yejin; Chae, Minwoo; Ko, Young Myoung; Bae, Young-Mok; Sim, Hyungsub; Oh, Young Chan; Noh, Keum Hwan20252025, vol.54, no.1
A refreshing take on the inverted Dirichlet via a mode parameterization with some statistical illustrationsOtto, A. F.; Ferreira, J. T.; Bekker, A.; Punzo, A.; Tomarchio, S. D.Otto, A. F.; Ferreira, J. T.; Bekker, A.; Punzo, A.; Tomarchio, S. D.20252025, vol.54, no.1
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