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期刊
ISSN
0968-4328
刊名
Micron
参考译名
微米
收藏年代
2002~2025
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2014, vol.56
2014, vol.57
2014, vol.58
2014, vol.59
2014, vol.60
2014, vol.61
2014, vol.62
2014, vol.63
2014, vol.64
2014, vol.65
2014, vol.66
2014, vol.67
题名
作者
出版年
年卷期
Determining the work function of a carbon-cone cold-field emitter by in situ electron holography
Ludvig de Knoop; Florent Houdellier; Christophe Gatel; Aurelien Masseboeuf; Marc Monthioux; Martin Hytch
2014
2014, vol.63
A perturbation theory study of electron vortices in electromagnetic fields: The case of infinitely long line charge and magnetic dipole
L. Xie; P. Wang; X. Q. Pan
2014
2014, vol.63
Site-specific ionisation edge fine-structure of Rutile in the electron microscope
Walid Hetaba; Stefan Loffler; Marc-Georg Willinger; Manfred Erwin Schuster; Robert Schlogl; Peter Schattschneider
2014
2014, vol.63
Autonomous reconstruction and segmentation of tomographic data
Markus Wollgarten; Michael Habeck
2014
2014, vol.63
Averaging scheme for atomic resolution off-axis electron holograms
T. Niermann; M. Lehmann
2014
2014, vol.63
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM
Hidetaka Sawada; Takeo Sasaki; Fumio Hosokawa; Kazutomo Suenaga
2014
2014, vol.63
A proposal for fs-electron microscopy experiments on high-energy excitations in solids
L. Piazza; P. Musumeci; O. J. Luiten; Fabrizio Carbone
2014
2014, vol.63
Testing the accuracy of the two-dimensional object model in HAADF STEM
Lewys Jones; Peter D. Nellist
2014
2014, vol.63
Atomic surface diffusion on Pt nanoparticles quantified by high-resolution transmission electron microscopy
S. Schneider; A. Surrey; D. Pohl; L. Schultz; B. Rellinghaus
2014
2014, vol.63
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images
G. T. Martinez; A. De Backer; A. Rosenauer; J. Verbeeck; S. Van Aert
2014
2014, vol.63
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