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ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2009, vol.40, no.1 2009, vol.40, no.2 2009, vol.40, no.3 2009, vol.40, no.4 2009, vol.40, no.5/6 2009, vol.40, no.7
2009, vol.40, no.8

题名作者出版年年卷期
HRTEM and TEM studies of amorphous structures in ZrNiTiCu base alloys obtained by rapid solidification or ball millingJ. Dutkiewicz; L. Litynska; W. Maziarz; R. Kocisko; M. Molnarova; A. Kovacova20092009, vol.40, no.1
On the structured imperfections of bulk GaSb using high resolution transmission electron microscopyCh. B. Lioutas; G. Zoulis; S. Konidaris; E. K. Polychroniadis; D. Stroz20092009, vol.40, no.1
Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopyM. Bhaskaran; S. Sriram; D. R. G. Mitchell; K. T. Short; A. S. Holland; A. Mitchell20092009, vol.40, no.1
Characterisation of phases in nanostructured, multilayered titanium alloys by analytical and high-resolution electron microscopyA. Czyrska-Filemonowicz; P. A. Buffat20092009, vol.40, no.1
In-situ SEM indentation studies of the deformation mechanisms in TiN, CrN and TiN/CrNK. Rzepiejewska-Malyska; M. Parlinska-Wojtan; K. Wasmer; K. Hejduk; J. Michler20092009, vol.40, no.1
Polychromatic microdiffraction characterization of defect gradients in severely deformed materialsRozaliya I. Barabash; Gene E. Ice; Wenjun Liu; Oleg M. Barabash20092009, vol.40, no.1
Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction methodM. Wzorek; A. Czerwinski; J. Ratajczak; R. Dylewicz; J. Katcki20092009, vol.40, no.1
The use of surface charging in the SEM for lithium niobate domain structure investigationL. S. Kokhanchik20092009, vol.40, no.1
Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM)Mariusz Pluska; Andrzej Czerwinski; Jacek Ratajczak; Jerzy Katcki; Lukasz Oskwarek; Remigiusz Rak20092009, vol.40, no.1
Local dynamic mechanical analysisRaphael Foschia; Marc Jobin; Stefan Hengsberger20092009, vol.40, no.1
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