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期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2008, vol.39, no.1 2008, vol.39, no.2 2008, vol.39, no.3 2008, vol.39, no.4 2008, vol.39, no.5 2008, vol.39, no.6
2008, vol.39, no.7 2008, vol.39, no.8

题名作者出版年年卷期
Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanateP. Harkins; M. MacKenzie; A. J. Craven; D. W. McComb20082008, vol.39, no.6
Nanomaterial electronic structure investigation by valence electron energy loss spectroscopy - An example of doped ZnO nanowiresJuan Wang; Quan Li; C. Ronning; D. Stichtenoth; S. Muller; D. Tang20082008, vol.39, no.6
Investigation of the oxide shell forming on ε-Co nanocrystalsN. Braidy; S. Behal; A. Adronov; G. A. Botton20082008, vol.39, no.6
Study of mean absorptive potential using Lenz model: Toward quantification of phase contrast from an electrostatic phase plateKo-Feng Chen; Chia-Seng Chang; Jessie Shiue; Yeukuang Hwu; Wei-Hau Chang; Ji-Jung Kai; Fu-Rong Chen20082008, vol.39, no.6
Observation of long-range compositional fluctuations in glasses: Implications for atomic and electronic structureNan Jiang; Jianrong Qiu; C. J. Humphreys; John C. H. Spence20082008, vol.39, no.6
Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscopeSergey Yakovlev; Matthew Libera20082008, vol.39, no.6
High-resolution Z-contrast imaging and EELS study of functional oxide materialsRobert F. Klie; Yuan Zhao; Guang Yang; Yimei Zhu20082008, vol.39, no.6
Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matterAdam P. Hitchcock; James J. Dynes; Goran Johansson; Jian Wang; Gianluigi Botton20082008, vol.39, no.6
Electron energy loss near edge structure (ELNES) spectra of AlN and AlGaN: A theoretical study using the Wien2k and Telnes programsD. Holec; P. M. F. J. Costa; P. D. Cherns; C. J. Humphreys20082008, vol.39, no.6
Fourier-ratio deconvolution and its Bayesian equivalentR. E. Egerton; F. Wang; M. Malac; M. S. Moreno; F. Hofer20082008, vol.39, no.6
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