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ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2024



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2003, vol.34, no.1 2003, vol.34, no.2 2003, vol.34, no.3-5 2003, vol.34, no.6-7 2003, vol.34, no.8

题名作者出版年年卷期
High resolution EELS using monochromator and high performance spectrometer: comparison of V{sub}2O{sub}5 ELNES with NEXAFS and band structure calculationsD. S. Su; H. W. Zandbergen; P. C. Tiemeijer; G. Kothleitner; M. Havecker; C. Hebert; A. Knop-Gericke; B. H. Freitag; F. Hofer; R. Schlogl20032003, vol.34, no.3-5
Inelastic electron scattering observation using energy filtered transmission electron microscopy for silicon-germanium nanostructures imagingR. Pantel; S. Jullian; D. Delille; D. Dutartre; A. Chantre; O. Kermarrec; Y. Campidelli; L. F. T. Z. Kwakman20032003, vol.34, no.3-5
New techniques in electron energy-loss spectroscopy and energy-filtered imagingR. F. Egerton20032003, vol.34, no.3-5
Theoretical prediction of ELNES/XANES and chemical bondings of AlN polytypesTeruyasu Mizoguchi; Isao Tanaka; Masahiro Kunisu; Masato Yoshiya; Hirohiko Adachi; W. Y. Ching20032003, vol.34, no.3-5
EELS performance measurements on a new high energy resolution imaging filterGerald Kothleitner; Ferdinand Hofer20032003, vol.34, no.3-5
Improvement of energy loss near edge structure calculation using Wien2kC. Hebert; J. Luitz; P. Schattschneider20032003, vol.34, no.3-5
Valence excitations in electron microscopy: resolved and unresolved issuesA. Howie20032003, vol.34, no.3-5
Application of automated crystallography for transmission electron microscopy in the study of grain-boundary segregationChunfei Li; David B. Williams20032003, vol.34, no.3-5
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectraI. Arslan; S. Ogut; P. D. Nellist; N. D. Browning20032003, vol.34, no.3-5
Evolution of microstructures in materials induced by electropulsingW. Zhang; M. L. Sui; Y. Z. Zhou; D. X. Li20032003, vol.34, no.3-5
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