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0915-1869
刊名
表面技術
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表面技术
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2000, vol.51, no.1
2000, vol.51, no.10
2000, vol.51, no.11
2000, vol.51, no.12
2000, vol.51, no.2
2000, vol.51, no.3
2000, vol.51, no.4
2000, vol.51, no.5
2000, vol.51, no.6
2000, vol.51, no.7
2000, vol.51, no.8
2000, vol.51, no.9
题名
作者
出版年
年卷期
Adhesive strength of Ni-P electrodeposits on substrates pretreated by an electrolytic jet with SiC particles
Hiromitsu Takeuchi; Yoshiki Tsunekawa; Masahiro Okumiya
2000
2000, vol.51, no.1
Application of self-assembled monolayer lithography: fabrication of gold microstructures through area-selective electroless plating
Hiroyuki Sugimura; Takayuki Hanji; Kazuya Ushiyama; Osamu Takai
2000
2000, vol.51, no.1
Basics and applications of scanning electrochemical microscopy
Hitoshi Shiku; Hiroaki Ohya; Tomokazu Matsue
2000
2000, vol.51, no.1
Corrosion resistance of Al-Cr alloy coated steel sheet by vapor deposition
Jun Katoh; Junji Kawafuku; Kuniyasu Araga; Atsushi Kihara
2000
2000, vol.51, no.1
Depth profiles of Na implanted in glass-like carbon and the change in atomic density for implanted layers
Masaya Iwaki; Kei-ichi Terashima
2000
2000, vol.51, no.1
Improvement on brightness of electroless nickel deposits using hydrazine as reducing agent
Shinji Yae; Kiyoshi Ito; Kenji Yamagishi; Hitoshi Matsuda
2000
2000, vol.51, no.1
In situ observation of growth and dissolution process of calcium phosphate crystals using atomic force microscopy
Kazuo Onuma
2000
2000, vol.51, no.1
In situ STM imaging of interfacial structures and reactions on electrodes
Takahiro Sawaguchi; Fumio Mizutani
2000
2000, vol.51, no.1
Monte Carlo simulation of thin film growth: surface structure and lattice defects
Yutaka Kaneko; Yasuaki Hiwatari; Katsuhiko Ohara; Tohru Murakami
2000
2000, vol.51, no.1
Near-field optical microscope for surface imaging and analysis
Hiroshi Muramatsu; Noritaka Yamamoto
2000
2000, vol.51, no.1
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