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1998, vol.42, no.1	1998, vol.42, no.10	1998, vol.42, no.11	1998, vol.42, no.12	1998, vol.42, no.2	1998, vol.42, no.3
1998, vol.42, no.4	1998, vol.42, no.5	1998, vol.42, no.6	1998, vol.42, no.7	1998, vol.42, no.8	1998, vol.42, no.9

题名	作者	出版年	年卷期
Discrimination of silicon wafer surface defects by laser scattered defect pattern	F. Hirata; Y. Tatsuno; S. Takahashi; Y. Takaya; T. Miyoshi	1998	1998, vol.42, no.2
Effects and characteristics of on-line roll grinding using ELID(electrolytic in-process dressing) method	D. W. Lee; H. Ohmori; I. Takahashi; T. Komatsu; T. Nakagawa	1998	1998, vol.42, no.2
Evaluation of diamond abrasives (4) TEM (transmission electron microscope)	K. Nishimura; A. Hiraki	1998	1998, vol.42, no.2
How to estimate grinding temperature and energy flowing rate into workpiece	T. Obikawa	1998	1998, vol.42, no.2
NC data compensation of wheels wear in aspherical grinding	S. Moriyasu; H. Ohmori; T. Nakagawa	1998	1998, vol.42, no.2
Study on truing technique of CBN wheel for ultrahigh speed grinding (1st report): influence of peripheral speeds of grinding wheel and diamond truer	M. Wakuda; K. Miyahara; T. Otani; M. Ota	1998	1998, vol.42, no.2
Surface residual stresses produced by shot peening and grit blasting	K. Tosha; K. Iida	1998	1998, vol.42, no.2
The formation of pattern traces of coated abrasives on cylindrical workpiece surfaces	S. Higuchi; T. Totsuka; Y. Saito	1998	1998, vol.42, no.2